P_2x3B_103_A

Production testing

Date:12/10/2007

Operator: Gino Bolla

start testing time:11:32 AM

Sensor: S_2x3B_10, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0W55_D3LQE4T16B
ROC1W55_D3LQE4T16A
ROC2W55_D3LQE4T15C
ROC3W52_DOLQC8T25C
ROC4W52_DOLQC8T26A
ROC5W52_DOLQC8T26C

Inspected by Lockwood Gale on date 12/5/2007
LR_dev0.051
LL_dev0.047

PLAQUETTE GLUED with HALF PRESSURE

FINAL COMMENT by Lockwood GaleForce used to join BBM to VHDI = 2.5 kg per ROC. No assembly problems. ROC 1, Ch 34, 2FL, 2 tries, No other wirebonding problems.

PLAQUETTE made READY for ENCAPSULATION on 12/5/2007 by Lockwood Gale

PLAQUETTE encapsulated on 12/7/2007 by Ozhan Koybasi

PLAQUETTE made READY for testing on 12/7/2007 by Ozhan Koybasi

P_2x3B_103_Aon 12/10/2007 11:32 AM

Depletion Voltage is -40 and suggested operational voltage is -80
Ibias_DAC, Ibias_DAC Data 142 162 164 162 140 142
Vana, VanaData 150 147 159 149 144 143
CalDelData and plots818694897590
VthrCompData and plots849093888682
TestDdata ,TestD Plots1002101
LightData ,Light Plots000000
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP at VMAX

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe1009511595185185
Vsf150145160145145145
VoffsetOp11010590856060
VIbias_PH100215110455050
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 4.116302

SIGMA = 0.319274
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 5.434914

SIGMA = 0.411597
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 4.896042

SIGMA = 0.363091
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 3.676294

SIGMA = 0.306924
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 4.931308

SIGMA = 0.381750
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 4.472054

SIGMA = 0.344964

Comment (if any): Good

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 11:59 AM