Sensor: S_2x3B_10, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROC | ROC wafer | Label |
---|---|---|
ROC0 | W55_D3LQE4T | 16B |
ROC1 | W55_D3LQE4T | 16A |
ROC2 | W55_D3LQE4T | 15C |
ROC3 | W52_DOLQC8T | 25C |
ROC4 | W52_DOLQC8T | 26A |
ROC5 | W52_DOLQC8T | 26C |
Inspected by Lockwood Gale on date 12/5/2007
LR_dev | 0.051 |
LL_dev | 0.047 |
PLAQUETTE GLUED with HALF PRESSURE
FINAL COMMENT by Lockwood Gale | Force used to join BBM to VHDI = 2.5 kg per ROC. No assembly problems. ROC 1, Ch 34, 2FL, 2 tries, No other wirebonding problems. |
PLAQUETTE made READY for ENCAPSULATION on 12/5/2007 by Lockwood Gale
PLAQUETTE encapsulated on 12/7/2007 by Ozhan Koybasi
PLAQUETTE made READY for testing on 12/7/2007 by Ozhan Koybasi
P_2x3B_103_Aon 12/10/2007 11:32 AM
Ibias_DAC, Ibias_DAC Data | 142 | 162 | 164 | 162 | 140 | 142 |
Vana, VanaData | 150 | 147 | 159 | 149 | 144 | 143 |
CalDelData and plots | 81 | 86 | 94 | 89 | 75 | 90 |
VthrCompData and plots | 84 | 90 | 93 | 88 | 86 | 82 | Depletion Voltage is -40 and suggested operational voltage is -80
TestDdata ,TestD Plots | 1 | 0 | 0 | 2 | 10 | 1 |
LightData ,Light Plots | 0 | 0 | 0 | 0 | 0 | 0 |
Pass/Fail TestD | GOOD | GOOD | GOOD | GOOD | GOOD | GOOD |
Pass/Fail LIGHT | GOOD | GOOD | GOOD | GOOD | GOOD | GOOD |
Noise MAP at VMAX
Efficiency MAP
EXTRA DACs for NOISE
VHldDe | 100 | 95 | 115 | 95 | 185 | 185 |
Vsf | 150 | 145 | 160 | 145 | 145 | 145 |
VoffsetOp | 110 | 105 | 90 | 85 | 60 | 60 |
VIbias_PH | 100 | 215 | 110 | 45 | 50 | 50 |
Comment (if any): Good
This Device have been tested 0Times prior to this one and here are the links to the previous tests:End testing time: 11:59 AM