Sensor: S_2x3B_09, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROC | ROC wafer | Label |
---|---|---|
ROC0 | W54_D2LQG4T | 26A |
ROC1 | W19_XN4K38T | 06C |
ROC2 | W19_XN4K38T | 68C |
ROC3 | W19_XN4K38T | 23D |
ROC4 | W19_XN4K38T | 24B |
ROC5 | W19_XN4K38T | 25B |
Inspected by Lockwood Gale on date 10/23/2007
LR_dev | 0.076 |
LL_dev | 0.064 |
PLAQUETTE GLUED with HALF PRESSURE
FINAL COMMENT by Lockwood Gale | Reworked BBM. Force used to join BBM to VHDI = 1.5 kg per ROC. No assembly problems. ROC 4, CH 11, wo, ROC 4 CH 18 1hb, ROC 3 Ch 3,17 wo bonded on second try, all wires bonded. |
PLAQUETTE made READY for ENCAPSULATION on 10/23/2007 by Lockwood Gale
PLAQUETTE encapsulated on 10/23/2007 by Ozhan Koybasi
PLAQUETTE made READY for testing on 10/23/2007 by Ozhan Koybasi
P_2x3B_091_Aon 10/23/2007 5:20 PM
Ibias_DAC, Ibias_DAC Data | 150 | 148 | 154 | 150 | 156 | 162 |
Vana, VanaData | 139 | 130 | 132 | 127 | 117 | 134 |
CalDelData and plots | 76 | 75 | 87 | 101 | 86 | 80 |
VthrCompData and plots | 90 | 78 | 69 | 67 | 69 | 86 | Depletion Voltage is -48 and suggested operational voltage is -88
TestDdata ,TestD Plots | 2 | 3 | 278 | 209 | 6 | 6 |
LightData ,Light Plots | 0 | 0 | 0 | 0 | 0 | 0 |
Pass/Fail TestD | GOOD | GOOD | BAD | BAD | GOOD | GOOD |
Pass/Fail LIGHT | GOOD | GOOD | GOOD | GOOD | GOOD | GOOD |
Noise MAP at VMAX
Efficiency MAP
EXTRA DACs for NOISE
VHldDe | 95 | 145 | 95 | 120 | 150 | 110 |
Vsf | 145 | 135 | 140 | 140 | 145 | 140 |
VoffsetOp | 110 | 90 | 65 | 65 | 75 | 105 |
VIbias_PH | 100 | 105 | 100 | 105 | 100 | 105 |
Comment (if any): test D showed too many bad pixels on two ROCs
This Device have been tested 0Times prior to this one and here are the links to the previous tests:End testing time: 5:51 PM