P_2x3B_066_C-1

Production testing

Date:4/23/2007

Operator: Gino Bolla

start testing time:3:06 PM

Sensor: S_2x3B_06, Data for leakage current measurement , and plot on overall it is a
ROCROC waferLabel
ROC0X94KFJT04D
ROC1X94KFJT23D
ROC2X94KFJT04B
ROC3X94KFJT34D
ROC4X94KFJT34B
ROC5X94KFJT24C

Depletion Voltage is -44 and suggested operational voltage is -84
Ibias_DAC, Ibias_DAC Data 142 122 124 144 144 148
Vana, VanaData 157 122 121 121 131 144
CalDelData and plots7910078848283
VthrCompData and plots865778787478
TestDdata ,TestD Plots1011013104
LightData ,Light Plots200031167
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD BAD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD BAD

Noise MAP

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe9515513516011090
Vsf150135130135145140
VoffsetOp1004575757595
VIbias_PH10011010010010095
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 4.537840

SIGMA = 0.364817
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 6.111119

SIGMA = 0.455407
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 5.157697

SIGMA = 0.389238
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 4.581897

SIGMA = 0.366581
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 4.859986

SIGMA = 0.404690
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 4.448680

SIGMA = 0.361759

Comment (if any):

This Device have been tested 1Times prior to this one and here are the links to the previous tests:

P_2x3B_066_C.html,

End testing time: 3:25 PM