P_2x3B_066_C

Production testing

Date:4/23/2007

Operator: mia tosi

start testing time:2:35 PM

Sensor: S_2x3B_06, Data for leakage current measurement , and plot on overall it is a
ROCROC waferLabel
ROC0X94KFJT04D
ROC1X94KFJT23D
ROC2X94KFJT04B
ROC3X94KFJT34D
ROC4X94KFJT34B
ROC5X94KFJT24C

Depletion Voltage is -108 and suggested operational voltage is -148
Ibias_DAC, Ibias_DAC Data 142 122 124 144 144 148
Vana, VanaData 157 123 121 121 132 144
CalDelData and plots7910078848283
VthrCompData and plots865878787578
TestDdata ,TestD Plots000000
LightData ,Light Plots200031167
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD BAD

Noise MAP

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe95150155145105100
Vsf150135140140140145
VoffsetOp1005070757590
VIbias_PH9590105105105100
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 4.451116

SIGMA = 0.339128
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 5.313720

SIGMA = 0.442437
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 5.450319

SIGMA = 0.433002
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 4.761417

SIGMA = 0.372268
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 5.079689

SIGMA = 0.443199
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 4.691262

SIGMA = 0.379889

Comment (if any):

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 2:56 PM