P_2x3B_053_A-1

Production testing

Date:11/15/2007

Operator: Ozhan Koybasi

start testing time:10:21 PM

Sensor: S_2x3B_05, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0W52_DOLQC8T40B
ROC1W52_DOLQC8T40A
ROC2W52_DOLQC8T58C
ROC3W52_DOLQC8T35B
ROC4W52_DOLQC8T35C
ROC5W52_DOLQC8T36C

Depletion Voltage is -46 and suggested operational voltage is -86
Ibias_DAC, Ibias_DAC Data 154 150 156 144 146 156
Vana, VanaData 144 145 137 132 158 144
CalDelData and plots858692908179
VthrCompData and plots819184899089
TestDdata ,TestD Plots052051
LightData ,Light Plots1752247511149818041481
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT BAD BAD BAD BAD BAD BAD

Noise MAP at VMAX

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe9010090120100105
Vsf145145145140160145
VoffsetOp100115105100110115
VIbias_PH95100100105100100
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 3.977479

SIGMA = 0.300055
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 4.060828

SIGMA = 0.301266
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 4.174878

SIGMA = 0.319116
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 4.021679

SIGMA = 0.301570
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 3.953045

SIGMA = 0.307357
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 3.974050

SIGMA = 0.320068

Comment (if any): light testing failed

This Device have been tested 1Times prior to this one and here are the links to the previous tests:

P_2x3B_053_A.html,

End testing time: 10:49 PM