P_2x3B_050_C-1

Production testing

Date:2/26/2007

Operator: Isaac Childres

start testing time:1:27 PM

Sensor: S_2x3B_05, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0XG4KFCT57A
ROC1XG4KFCT56A
ROC2XG4KFCT54B
ROC3XG4KFCT55A
ROC4XG4KFCT51A
ROC5XG4KFCT53A

Depletion Voltage is -44 and suggested operational voltage is -84
Ibias_DAC, Ibias_DAC Data 132 144 134 140 134 144
Vana, VanaData 124 145 121 120 125 128
CalDelData and plots868186818169
VthrCompData and plots709366708474
TestDdata ,TestD Plots01600000
LightData ,Light Plots000100
Pass/Fail TestD GOOD BAD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe125110180135140120
Vsf140135155135135140
VoffsetOp759045858575
VIbias_PH10510010010095105
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 5.489908

SIGMA = 0.420693
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 4.352945

SIGMA = 0.344710
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 5.100669

SIGMA = 0.395296
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 4.668818

SIGMA = 0.367311
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 4.890794

SIGMA = 0.404450
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 4.880890

SIGMA = 0.376569

Comment (if any): Double-column still dead. Debugging.

This Device have been tested 1Times prior to this one and here are the links to the previous tests:

P_2x3B_050_C.html,

End testing time: 1:46 PM