P_2x3B_050

P_2x3B_050_C

Production testing

Date:2/26/2007

Operator: Joseph Clampitt

start testing time:11:15 AM

Sensor: S_2x3B_05, Data for leakage current measurement , and plot on overall it is a GOOD sensor

ROC ROC wafer Label

ROC0 XG4KFCT 57A

ROC1 XG4KFCT 56A

ROC2 XG4KFCT 54B

ROC3 XG4KFCT 55A

ROC4 XG4KFCT 51A

ROC5 XG4KFCT 53A

ROC	ROC wafer	Label
ROC0	XG4KFCT	57A
ROC1	XG4KFCT	56A
ROC2	XG4KFCT	54B
ROC3	XG4KFCT	55A
ROC4	XG4KFCT	51A
ROC5	XG4KFCT	53A

Depletion Voltage is -48 and suggested operational voltage is -88

Ibias_DAC, Ibias_DAC Data 132 146 134 140 134 144

Vana, VanaData 124 145 121 120 124 128

CalDelData and plots 86 81 86 81 81 69

VthrCompData and plots 70 93 66 70 83 74

TestDdata ,TestD Plots 1 160 0 0 1 1

LightData ,Light Plots 0 0 0 1 0 0

Pass/Fail TestD GOOD BAD GOOD GOOD GOOD GOOD

Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP

Efficiency MAP

EXTRA DACs for NOISE

VHldDe	120	120	125	130	150	120
Vsf	140	140	130	135	140	140
VoffsetOp	75	85	45	85	80	75
VIbias_PH	105	100	105	100	105	105

ROC0 NOISE			MEAN = 5.507837 SIGMA = 0.432917
ROC1 NOISE			MEAN = 4.446983 SIGMA = 0.362534
ROC2 NOISE			MEAN = 5.290788 SIGMA = 0.398450
ROC3 NOISE			MEAN = 4.673340 SIGMA = 0.375790
ROC4 NOISE			MEAN = 5.331773 SIGMA = 0.433000
ROC5 NOISE			MEAN = 4.865129 SIGMA = 0.368731

Comment (if any): Good

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 11:34 AM

Ibias_DAC, Ibias_DAC Data	132	146	134	140	134	144
Vana, VanaData	124	145	121	120	124	128
CalDelData and plots	86	81	86	81	81	69
VthrCompData and plots	70	93	66	70	83	74
TestDdata ,TestD Plots	1	160	0	0	1	1
LightData ,Light Plots	0	0	0	1	0	0
Pass/Fail TestD	GOOD	BAD	GOOD	GOOD	GOOD	GOOD
Pass/Fail LIGHT	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD