P_1x5R_178_C-1

Production testing

Date:5/15/2007

Operator: Emily Grace

start testing time:1:28 PM

Sensor: S_1x5R_17, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0KFNG13T26D
ROC1KFNG13T36A
ROC2KFNG13T36D
ROC3KFNG13T16B
ROC4KFNG13T46C

Depletion Voltage is -52 and suggested operational voltage is -92
Ibias_DAC, Ibias_DAC Data 148 150 174 140 156
Vana, VanaData 133 129 135 127 135
CalDelData and plots9180728173
VthrCompData and plots7571747687
TestDdata ,TestD Plots00000
LightData ,Light Plots00000
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD

Noise MAP at VMAX

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe11590100120115
Vsf145140140135140
VoffsetOp75759070100
VIbias_PH1051001009595
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 4.757122

SIGMA = 0.391396
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 4.391627

SIGMA = 0.356245
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 4.175895

SIGMA = 0.328604
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 4.418443

SIGMA = 0.380361
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 3.976970

SIGMA = 0.333231

Comment (if any):

This Device have been tested 1Times prior to this one and here are the links to the previous tests:

P_1x5R_178_C.html,

End testing time: 1:54 PM