P_1x5R_178_C

Production testing

Date:5/15/2007

Operator: Emily Grace

start testing time:12:57 PM

Sensor: S_1x5R_17, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0KFNG13T26D
ROC1KFNG13T36A
ROC2KFNG13T36D
ROC3KFNG13T16B
ROC4KFNG13T46C

Depletion Voltage is -54 and suggested operational voltage is -94
Ibias_DAC, Ibias_DAC Data 148 148 174 140 156
Vana, VanaData 133 130 135 127 137
CalDelData and plots9280728173
VthrCompData and plots7572747687
TestDdata ,TestD Plots00000
LightData ,Light Plots00000
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD

Noise MAP at VMAX

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe1108595125100
Vsf140140140140140
VoffsetOp75759070100
VIbias_PH10510010095100
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 4.793847

SIGMA = 0.395890
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 4.426821

SIGMA = 0.366939
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 4.211903

SIGMA = 0.330073
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 4.378191

SIGMA = 0.364544
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 4.208078

SIGMA = 0.344107

Comment (if any):

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 1:24 PM