P_1x5R_171_A-1

Production testing

Date:2/9/2007

Operator: Gino Bolla

start testing time:8:56 AM

Sensor: S_1x5R_17, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0W30_X74K5RT26D
ROC1W30_X74K5RT26C
ROC2W30_X74K5RT26B
ROC3W30_X74K5RT26A
ROC4W30_X74K5RT25D

FIXED (not measured) Depletion Voltage is -50 and FIXED (not measured) suggested operational voltage is -150
Ibias_DAC, Ibias_DAC Data 138 126 134 136 126
Vana, VanaData 127 115 122 121 132
TestDdata ,TestD Plots00010
LightData ,Light Plots00000
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD

Noise MAP

[IMAGE] of

Efficiency MAP

[IMAGE] of

ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 5.112920

SIGMA = 0.395855
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 4.496442

SIGMA = 0.359923
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 4.227598

SIGMA = 0.330737
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 4.087200

SIGMA = 0.317448
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 5.274742

SIGMA = 0.426209

Comment (if any):

This Device have been tested 1Times prior to this one and here are the links to the previous tests:

P_1x5R_171_A.html,

End testing time: 9:09 AM