P_1x5L_007

P_1x5L_007_A-3

Production testing

Date:2/26/2008

Operator: Ozhan Koybasi

start testing time:1:45 PM

Sensor: S_1x5L_00, Data for leakage current measurement , and plot on overall it is a GOOD sensor

ROC ROC wafer Label

ROC0 W55_D3LQE4T 03A

ROC1 W55_D3LQE4T 12B

ROC2 W55_D3LQE4T 12A

ROC3 W55_D3LQE4T 43D

ROC4 W55_D3LQE4T 43C

ROC	ROC wafer	Label
ROC0	W55_D3LQE4T	03A
ROC1	W55_D3LQE4T	12B
ROC2	W55_D3LQE4T	12A
ROC3	W55_D3LQE4T	43D
ROC4	W55_D3LQE4T	43C

Depletion Voltage is -50 and suggested operational voltage is -90

Ibias_DAC, Ibias_DAC Data 164 154 150 176 172

Vana, VanaData 141 160 150 156 137

CalDelData and plots 90 87 89 81 86

VthrCompData and plots 82 94 91 90 91

TestDdata ,TestD Plots 0 0 0 0 1

LightData ,Light Plots 0 31 146 36 40

Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD

Pass/Fail LIGHT GOOD GOOD BAD GOOD GOOD

Noise MAP at VMAX

Efficiency MAP

EXTRA DACs for NOISE

VHldDe	90	100	100	100	120
Vsf	140	160	150	150	140
VoffsetOp	100	95	115	130	115
VIbias_PH	100	100	95	100	100

ROC0 NOISE			MEAN = 4.147679 SIGMA = 0.331233
ROC1 NOISE			MEAN = 4.351593 SIGMA = 0.357225
ROC2 NOISE			MEAN = 24870.811015 SIGMA = 302089.705633
ROC3 NOISE			MEAN = -24378.550115 SIGMA = 326158.514050
ROC4 NOISE			MEAN = 3.737284 SIGMA = 0.281904

Comment (if any):

This Device have been tested 3Times prior to this one and here are the links to the previous tests:

P_1x5L_007_A-1.html,

P_1x5L_007_A-2.html,

P_1x5L_007_A.html,

End testing time: 2:13 PM

Ibias_DAC, Ibias_DAC Data	164	154	150	176	172
Vana, VanaData	141	160	150	156	137
CalDelData and plots	90	87	89	81	86
VthrCompData and plots	82	94	91	90	91
TestDdata ,TestD Plots	0	0	0	0	1
LightData ,Light Plots	0	31	146	36	40
Pass/Fail TestD	GOOD	GOOD	GOOD	GOOD	GOOD
Pass/Fail LIGHT	GOOD	GOOD	BAD	GOOD	GOOD