P_1x5L_007

P_1x5L_007_A-2

Production testing

Date:2/26/2008

Operator: Ozhan Koybasi

start testing time:12:40 PM

Sensor: S_1x5L_00, Data for leakage current measurement , and plot on overall it is a GOOD sensor

ROC ROC wafer Label

ROC0 W55_D3LQE4T 03A

ROC1 W55_D3LQE4T 12B

ROC2 W55_D3LQE4T 12A

ROC3 W55_D3LQE4T 43D

ROC4 W55_D3LQE4T 43C

ROC	ROC wafer	Label
ROC0	W55_D3LQE4T	03A
ROC1	W55_D3LQE4T	12B
ROC2	W55_D3LQE4T	12A
ROC3	W55_D3LQE4T	43D
ROC4	W55_D3LQE4T	43C

Depletion Voltage is -50 and suggested operational voltage is -90

Ibias_DAC, Ibias_DAC Data 164 152 150 176 170

Vana, VanaData 142 160 150 157 137

CalDelData and plots 90 87 89 81 86

VthrCompData and plots 83 93 90 90 91

TestDdata ,TestD Plots 0 0 0 0 1

LightData ,Light Plots 0 31 147 36 41

Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD

Pass/Fail LIGHT GOOD GOOD BAD GOOD BAD

Noise MAP at VMAX

Efficiency MAP

EXTRA DACs for NOISE

VHldDe	85	100	100	100	120
Vsf	140	160	150	150	140
VoffsetOp	100	95	115	130	115
VIbias_PH	105	100	95	100	100

ROC0 NOISE			MEAN = 4.247779 SIGMA = 0.323449
ROC1 NOISE			MEAN = 4.360980 SIGMA = 0.348099
ROC2 NOISE			MEAN = 3.808011 SIGMA = 0.290668
ROC3 NOISE			MEAN = 3.475413 SIGMA = 0.270534
ROC4 NOISE			MEAN = 3.740277 SIGMA = 0.286193

Comment (if any):

This Device have been tested 2Times prior to this one and here are the links to the previous tests:

P_1x5L_007_A-1.html,

P_1x5L_007_A.html,

End testing time: 1:07 PM

Ibias_DAC, Ibias_DAC Data	164	152	150	176	170
Vana, VanaData	142	160	150	157	137
CalDelData and plots	90	87	89	81	86
VthrCompData and plots	83	93	90	90	91
TestDdata ,TestD Plots	0	0	0	0	1
LightData ,Light Plots	0	31	147	36	41
Pass/Fail TestD	GOOD	GOOD	GOOD	GOOD	GOOD
Pass/Fail LIGHT	GOOD	GOOD	BAD	GOOD	BAD