Sensor: S_1x2R_11, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROC | ROC wafer | Label |
---|---|---|
ROC0 | XW4KFXT | 05D |
ROC1 | XW4KFXT | 12A |
Inspected by Lockwood Gale on date 4/13/2007
LR_dev | 0.018 |
LL_dev | 0.041 |
PLAQUETTE GLUED with HALF PRESSURE
FINAL COMMENT by Lockwood Gale | No assembly problems. Assembled at HALF-PRESSURE."ROC0 chn 19 two bond attempts, no other wirebonding problems." |
PLAQUETTE made READY for ENCAPSULATION on 4/13/2007 by Lockwood Gale
PLAQUETTE encapsulated on 4/13/2007 P_1x5L_032_C by Ozhan Koybasi
PLAQUETTE made READY for testing on 4/13/2007 P_1x5L_032_C by Ozhan Koybasi
P_1x2R_110_Con 4/16/2007 2:50 PM
Ibias_DAC, Ibias_DAC Data | 138 | 130 |
Vana, VanaData | 133 | 143 |
CalDelData and plots | 79 | 72 |
VthrCompData and plots | 83 | 90 | Depletion Voltage is -50 and suggested operational voltage is -90
TestDdata ,TestD Plots | 0 | 0 |
LightData ,Light Plots | 1 | 0 |
Pass/Fail TestD | GOOD | GOOD |
Pass/Fail LIGHT | GOOD | GOOD |
Noise MAP
Efficiency MAP
EXTRA DACs for NOISE
VHldDe | 110 | 110 |
Vsf | 140 | 140 |
VoffsetOp | 115 | 100 |
VIbias_PH | 100 | 100 |
ROC0 NOISE | MEAN = 4.683906SIGMA = 0.382137 | ||
ROC1 NOISE | MEAN = 5.369221SIGMA = 0.427105 |
Comment (if any): Good.
This Device have been tested 0Times prior to this one and here are the links to the previous tests:End testing time: 3:07 PM