P_1x2R_110_C

Production testing

Date:4/16/2007

Operator: Isaac Childres

start testing time:2:50 PM

Sensor: S_1x2R_11, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0XW4KFXT05D
ROC1XW4KFXT12A

Inspected by Lockwood Gale on date 4/13/2007
LR_dev0.018
LL_dev0.041

PLAQUETTE GLUED with HALF PRESSURE

FINAL COMMENT by Lockwood GaleNo assembly problems. Assembled at HALF-PRESSURE."ROC0 chn 19 two bond attempts, no other wirebonding problems."

PLAQUETTE made READY for ENCAPSULATION on 4/13/2007 by Lockwood Gale

PLAQUETTE encapsulated on 4/13/2007 P_1x5L_032_C by Ozhan Koybasi

PLAQUETTE made READY for testing on 4/13/2007 P_1x5L_032_C by Ozhan Koybasi

P_1x2R_110_Con 4/16/2007 2:50 PM

Depletion Voltage is -50 and suggested operational voltage is -90
Ibias_DAC, Ibias_DAC Data 138 130
Vana, VanaData 133 143
CalDelData and plots7972
VthrCompData and plots8390
TestDdata ,TestD Plots00
LightData ,Light Plots10
Pass/Fail TestD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD

Noise MAP

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe110110
Vsf140140
VoffsetOp115100
VIbias_PH100100
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 4.683906

SIGMA = 0.382137
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 5.369221

SIGMA = 0.427105

Comment (if any): Good.

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 3:07 PM