P_1x2L_004_C-2

Production testing

Date:2/8/2007

Operator: Gino Bolla

start testing time:3:37 PM

Sensor: S_1x2L_00, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0XG4KFCT76B
ROC1XG4KFCT76A

FIXED (not measured) Depletion Voltage is -50 and FIXED (not measured) suggested operational voltage is -150
Ibias_DAC, Ibias_DAC Data 138 144
Vana, VanaData 144 144
TestDdata ,TestD Plots00
LightData ,Light Plots00
Pass/Fail TestD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD

Noise MAP

[IMAGE] of

Efficiency MAP

[IMAGE] of

ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 5.489886

SIGMA = 0.428269
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 5.202050

SIGMA = 0.401998

Comment (if any):

This Device have been tested 2Times prior to this one and here are the links to the previous tests:

P_1x2L_004_C-1.html,

P_1x2L_004_C.html,

End testing time: 3:51 PM