Test Date: 2016-01-06 15:14
Analysis date: 2016-05-25 17:00
M-G-3-46 ModuleFPIXTest_m20_1
Chips

Overview

_
Summary 1
Module Module M-G-3-46
Grade Grade A
ElectricalGrade Electrical Grade A
IVGrade IV Grade A
ManualGrade Manual Grade None
PixelDefects Pixel Defects - A/B/C 8 - 16/0/0
DeadPixels Dead Pixels 0
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 2
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 5
NoisyPixels Noise Defects 0
TrimProblems Trim Problems 0
PHGainDefects PH Gain Defects 2
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 0
Summary 2
TestCenter Test Center FNAL
TestDate Test Date 2016-01-06
TestTime Test Time 15:14
TestDuration Test Duration 1:45:04
TempC Temparature -20 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok, 0xf8 0xe4
TBM2 TBM2 ok, 0x00 0xe4
PxarVersion pXar prod-12
ModuleIa Module Ia 381.9 mA
IVCurve
CurrentAtVoltage150V I_orig(150V) @ -20.0 °C 0.00 μA
Variation I(150 V) / I(100 V) 1.12
recalculatedCurrentAtVoltage150V I_rec(150 V) @ 17°C 0.09 μA
recalculatedCurrentVariation I_rec(150 V) / I_rec(100 V) 1.12
Summary 3
Noise Noise 103.91 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 41.72 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.03 %
RelGainWidthROCs Rel. Gain W. grades 16/0/0
PedestalSpread Pedestal Spread 1028.69 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 0.63
Parameter1ROCs Par1 grades 16/0/0
CurrentAtVoltage150V I_rec(150 V) @ 17°C 0.09 μA
CurrentAtVoltage150V_ORIG I_orig(150V) @ -20.0 °C 0.00 μA
CurrentVariation I(150 V) / I(100 V) 1.12
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
Digital Current
Duration Duration 1:45:04
MinCurrent min. Current 0.439 A
MaxCurrent max. Current 0.475 A
Analog Current
Duration Duration 1:45:04
MinCurrent min. Current 0.378 A
MaxCurrent max. Current 0.384 A
ModuleIa Module Ia 381.9 mA
IanaLoss
IanaLossProblems Iana problems No
Mean mean 19.35
Min min 18.50
Max max 20.10
Temperature
Temperature Temp. while test -19.96 +/- 0.02 °C
Duration Duration of test 0:05:29
Summary ROCs
ROC Grade Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1 Mean noise Thr [e-] Thr width Rel gain width Ped spread
Chip 0
A
0
0
0
0
0
0
0
0
0
0
0
99.00
1750
40
0.025
1137
Chip 1
A
1
0
0
0
0
0
0
1
0
0
0
105.73
1750
42
0.028
1018
Chip 2
A
1
0
0
1
0
0
0
0
0
0
0
98.83
1750
40
0.028
1060
Chip 3
A
0
0
0
0
0
0
0
0
0
0
0
109.24
1750
42
0.031
1026
Chip 4
A
0
0
0
0
0
0
0
0
0
0
0
93.37
1750
40
0.023
1014
Chip 5
A
0
0
0
0
0
0
0
0
0
0
0
104.90
1748
42
0.025
1004
Chip 6
A
0
0
0
0
0
0
0
0
0
0
0
94.45
1752
40
0.023
896
Chip 7
A
0
0
0
0
0
0
0
0
0
0
0
100.95
1748
40
0.024
1106
Chip 8
A
0
0
0
0
0
0
0
0
0
0
0
106.13
1750
40
0.025
1158
Chip 9
A
1
0
0
0
0
0
0
1
1
0
0
115.25
1752
48
0.032
1166
Chip 10
A
1
0
0
1
0
0
0
0
0
0
0
106.60
1750
41
0.026
1078
Chip 11
A
1
0
0
1
0
0
0
0
0
0
0
110.56
1748
43
0.029
964
Chip 12
A
0
0
0
0
0
0
0
0
0
0
0
107.20
1748
44
0.026
938
Chip 13
A
2
0
0
1
0
0
0
0
1
0
0
103.63
1750
40
0.029
1004
Chip 14
A
1
0
0
1
0
0
0
0
0
0
0
104.64
1750
44
0.020
1045
Chip 15
A
0
0
0
0
0
0
0
0
0
0
0
102.09
1750
40
0.026
846
Readback par0vd
Readback par1vd
Readback par0va
Readback par1va
Readback par0rbia
Readback par1rbia
Readback par0tbia
Readback par1tbia
Readback par2tbia
TBM
nTBMs n 1
TBMType Type tbm08c
Core0a_basea Core 0a base a 0xe4
Core0a_basee Core 0a base e 0xf8
Core0b_basea Core 0b base a 0xe4
Core0b_basee Core 0b base e 0x00
RocDelay_Ch0 Roc Delay Ch0 4
RocDelay_Ch1 Roc Delay Ch1 4
RocDelay_Ch2 Roc Delay Ch2 4
RocDelay_Ch3 Roc Delay Ch3 4
Phase400 Phase 400 6
Phase160 Phase 160 7
Errors
nCriticals # Criticals 2
nErrors # Errors 525
nWarnings # Warnings 16
channel_0_count Channel 0 40
channel_1_count Channel 1 53
channel_2_count Channel 2 0
channel_3_count Channel 3 0
message_tokenchain_count Token Chain Length 58
message_eventid_count Event ID mismatch 12
message_readback_count Readback start marker 16
message_notokenpass_count has NoTokenPass 7
message_datasize_count Data size criticals 1
message_missingevents_count Missing Event criticals 1
message_usbtimeout_count USB criticals 0
message_deser400_count DESER400 failure 0
message_daqerror_count DAQ error 0
GradingParameters
ModifiedGrading Modified Grading ?
GradingParameters_XRayHighRateEfficiency_NInterpolationRates XRayHighRateEfficiency_NInterpolationRates 2 => 3
Logfile

Overview

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