Test Date: 2016-02-01 10:26
Analysis date: 2016-05-25 08:22
M-G-1-36 ModuleFPIXTest_m20_1
Chips

Overview

_
Summary 1
Module Module M-G-1-36
Grade Grade C
ElectricalGrade Electrical Grade C
IVGrade IV Grade A
ManualGrade Manual Grade None
PixelDefects Pixel Defects - A/B/C 4164 - 15/0/1
DeadPixels Dead Pixels 4160
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 1
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 4
NoisyPixels Noise Defects 0
TrimProblems Trim Problems 0
PHGainDefects PH Gain Defects 0
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 4160
Summary 2
TestCenter Test Center FNAL
TestDate Test Date 2016-02-01
TestTime Test Time 10:26
TestDuration Test Duration 1:15:44
TempC Temparature -20 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok, 0x84 0x49
TBM2 TBM2 ok, 0x00 0x49
PxarVersion pXar prod-12
ModuleIa Module Ia 369 mA
IVCurve
CurrentAtVoltage150V I_orig(150V) @ -20.0 °C 0.00 μA
Variation I(150 V) / I(100 V) 1.06
recalculatedCurrentAtVoltage150V I_rec(150 V) @ 17°C 0.08 μA
recalculatedCurrentVariation I_rec(150 V) / I_rec(100 V) 1.06
Summary 3
Noise Noise 100.82 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 39.41 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.03 %
RelGainWidthROCs Rel. Gain W. grades 16/0/0
PedestalSpread Pedestal Spread 929.22 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 0.54
Parameter1ROCs Par1 grades 15/0/1
CurrentAtVoltage150V I_rec(150 V) @ 17°C 0.08 μA
CurrentAtVoltage150V_ORIG I_orig(150V) @ -20.0 °C 0.00 μA
CurrentVariation I(150 V) / I(100 V) 1.06
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
Digital Current
Duration Duration 1:15:44
MinCurrent min. Current 0.436 A
MaxCurrent max. Current 0.47 A
Analog Current
Duration Duration 1:15:44
MinCurrent min. Current 0.359 A
MaxCurrent max. Current 0.371 A
ModuleIa Module Ia 369 mA
IanaLoss
IanaLossProblems Iana problems Yes
Mean mean 18.69
Min min 0.00
Max max 20.90
Temperature
Temperature Temp. while test -19.73 +/- 0.02 °C
Duration Duration of test 0:05:33
Summary ROCs
ROC Grade Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1 Mean noise Thr [e-] Thr width Rel gain width Ped spread
Chip 0
A
0
0
0
0
0
0
0
0
0
0
0
106.24
1750
41
0.030
1072
Chip 1
A
0
0
0
0
0
0
0
0
0
0
0
106.71
1750
40
0.031
1030
Chip 2
A
0
0
0
0
0
0
0
0
0
0
0
105.64
1750
42
0.034
1090
Chip 3
A
0
0
0
0
0
0
0
0
0
0
0
113.80
1748
44
0.028
985
Chip 4
A
0
0
0
0
0
0
0
0
0
0
0
102.46
1750
43
0.029
1077
Chip 5
A
1
0
0
1
0
0
0
0
0
0
0
110.94
1749
42
0.032
881
Chip 6
A
0
0
0
0
0
0
0
0
0
0
0
106.02
1750
40
0.026
972
Chip 7
A
2
0
0
2
0
0
0
1
0
0
0
114.73
1750
43
0.034
882
Chip 8
A
0
0
0
0
0
0
0
0
0
0
0
106.20
1750
43
0.023
1098
Chip 9
C
4160
4160
0
0
0
0
0
0
0
0
4160
0.00
0
0
0.000
0
Chip 10
A
1
0
0
1
0
0
0
0
0
0
0
109.27
1752
42
0.033
989
Chip 11
A
0
0
0
0
0
0
0
0
0
0
0
98.91
1750
40
0.022
1044
Chip 12
A
0
0
0
0
0
0
0
0
0
0
0
108.62
1750
44
0.031
965
Chip 13
A
0
0
0
0
0
0
0
0
0
0
0
103.40
1750
42
0.028
957
Chip 14
A
0
0
0
0
0
0
0
0
0
0
0
112.99
1750
42
0.028
908
Chip 15
A
0
0
0
0
0
0
0
0
0
0
0
107.22
1750
42
0.026
918
Readback par0vd
Readback par1vd
Readback par0va
Readback par1va
Readback par0rbia
Readback par1rbia
Readback par0tbia
Readback par1tbia
Readback par2tbia
TBM
nTBMs n 1
TBMType Type tbm08c
Core0a_basea Core 0a base a 0x49
Core0a_basee Core 0a base e 0x84
Core0b_basea Core 0b base a 0x49
Core0b_basee Core 0b base e 0x00
RocDelay_Ch0 Roc Delay Ch0 1
RocDelay_Ch1 Roc Delay Ch1 1
RocDelay_Ch2 Roc Delay Ch2 1
RocDelay_Ch3 Roc Delay Ch3 1
Phase400 Phase 400 1
Phase160 Phase 160 4
Errors
nCriticals # Criticals 0
nErrors # Errors 2
nWarnings # Warnings 2
channel_0_count Channel 0 0
channel_1_count Channel 1 0
channel_2_count Channel 2 0
channel_3_count Channel 3 0
message_tokenchain_count Token Chain Length 0
message_eventid_count Event ID mismatch 0
message_readback_count Readback start marker 0
message_notokenpass_count has NoTokenPass 0
message_datasize_count Data size criticals 0
message_missingevents_count Missing Event criticals 0
message_usbtimeout_count USB criticals 0
message_deser400_count DESER400 failure 0
message_daqerror_count DAQ error 0
GradingParameters
ModifiedGrading Modified Grading ?
GradingParameters_XRayHighRateEfficiency_NInterpolationRates XRayHighRateEfficiency_NInterpolationRates 2 => 3
Logfile

Overview

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