P_1x5R_164_A

Production testing

Date:12/13/2007

Operator: Gino Bolla

start testing time:10:08 AM

Sensor: S_1x5R_16, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0W53_DXLQG9T58D
ROC1W53_DXLQG9T58C
ROC2W53_DXLQG9T58B
ROC3W53_DXLQG9T58A
ROC4W53_DXLQG9T57D

Inspected by Lockwood Gale on date 12/11/2007
LR_dev0.010
LL_dev0.012

PLAQUETTE GLUED with HALF PRESSURE

FINAL COMMENT by Lockwood GaleForce used to join BBM to VHDI = 2 kg per ROC. No assembly problems. ROC0 ch5,6 wo 2 tries each. No other wirebonding problems.

PLAQUETTE made READY for ENCAPSULATION on 12/11/2007 by Lockwood Gale

PLAQUETTE encapsulated on 12/12/2007 by Ozhan Koybasi

PLAQUETTE made READY for testing on 12/12/2007 by Ozhan Koybasi

P_1x5R_164_Aon 12/13/2007 10:08 AM

Depletion Voltage is -50 and suggested operational voltage is -90
Ibias_DAC, Ibias_DAC Data 156 154 146 162 166
Vana, VanaData 139 139 150 163 146
CalDelData and plots7786846977
VthrCompData and plots8982839392
TestDdata ,TestD Plots02300
LightData ,Light Plots371000
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD

Noise MAP at VMAX

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe1051059010095
Vsf140140150160145
VoffsetOp95105125130120
VIbias_PH105105100100100
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 4.338623

SIGMA = 0.341796
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 4.127667

SIGMA = 0.326221
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 3.990318

SIGMA = 0.329534
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 3.485496

SIGMA = 0.273709
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 3.612440

SIGMA = 0.279458

Comment (if any):

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 10:34 AM