P_1x5L_110

P_1x5L_110_C

Production testing

Date:4/16/2007

Operator: Isaac Childres

start testing time:3:14 PM

Sensor: S_1x5L_11, Data for leakage current measurement , and plot on overall it is a GOOD sensor

ROC ROC wafer Label

ROC0 XW4KFXT 06A

ROC1 XW4KFXT 20D

ROC2 XW4KFXT 05B

ROC3 XW4KFXT 11B

ROC4 XW4KFXT 12C

ROC	ROC wafer	Label
ROC0	XW4KFXT	06A
ROC1	XW4KFXT	20D
ROC2	XW4KFXT	05B
ROC3	XW4KFXT	11B
ROC4	XW4KFXT	12C

Inspected by Lockwood Gale on date 4/12/2007

LR_dev 0.064

LL_dev 0.073

PLAQUETTE GLUED with HALF PRESSURE

FINAL COMMENT by Lockwood Gale

No assembly problems. Assembled at HALF-PRESSURE.No wirebond problems.

PLAQUETTE made READY for ENCAPSULATION on 4/12/2007 by Lockwood Gale

PLAQUETTE encapsulated on 4/12/2007 P_1x5R_077_C by Ozhan Koybasi

PLAQUETTE made READY for testing on 4/12/2007 P_1x5R_077_C by Ozhan Koybasi

P_1x5L_110_Con 4/16/2007 3:14 PM

Depletion Voltage is -46 and suggested operational voltage is -86

Ibias_DAC, Ibias_DAC Data	132	126	124	124	128
Vana, VanaData	117	122	133	120	129
CalDelData and plots	99	89	87	89	92
VthrCompData and plots	64	67	66	70	75
TestDdata ,TestD Plots	0	3	0	0	0
LightData ,Light Plots	0	0	0	0	1
Pass/Fail TestD	GOOD	GOOD	GOOD	GOOD	GOOD
Pass/Fail LIGHT	GOOD	GOOD	GOOD	GOOD	GOOD

Noise MAP

Efficiency MAP

EXTRA DACs for NOISE

VHldDe	140	135	115	175	130
Vsf	140	135	135	135	140
VoffsetOp	75	45	80	60	90
VIbias_PH	100	110	95	105	95

ROC0 NOISE			MEAN = 5.089397 SIGMA = 0.391842
ROC1 NOISE			MEAN = 5.952382 SIGMA = 0.480158
ROC2 NOISE			MEAN = 5.105104 SIGMA = 0.402231
ROC3 NOISE			MEAN = 5.911035 SIGMA = 0.472497
ROC4 NOISE			MEAN = 4.936843 SIGMA = 0.381943

Comment (if any): Good.

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 3:32 PM