P_2x5_123_A

Production testing

Date:11/26/2007

Operator: Ozhan Koybasi

start testing time:6:10 PM

Sensor: S_2x5_123, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0W47_DXLQF5T11C
ROC1W47_DXLQF5T29C
ROC2W47_DXLQF5T29A
ROC3W55_D3LQE4T06D
ROC4W47_DXLQF5T28C
ROC5W55_D3LQE4T62A
ROC6W55_D3LQE4T62B
ROC7W55_D3LQE4T62D
ROC8W55_D3LQE4T63A
ROC9W55_D3LQE4T63B

Depletion Voltage is -44 and suggested operational voltage is -84
Ibias_DAC, Ibias_DAC Data 172 158 164 154 160 160 156 154 160 144
Vana, VanaData 144 127 139 130 139 145 147 138 134 135
CalDelData and plots799474105818382967698
VthrCompData and plots88738274929087859190
TestDdata ,TestD Plots21100000141
LightData ,Light Plots0000000000
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP at VMAX

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe951051051201051009595105120
Vsf150140140140140145150140140140
VoffsetOp115105135901151001159010085
VIbias_PH9510010010510095951059595
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 3.622230

SIGMA = 0.285755
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 4.324102

SIGMA = 0.332393
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 3.370436

SIGMA = 0.267010
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 4.266256

SIGMA = 0.321752
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 4.003206

SIGMA = 0.316146
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 3.771592

SIGMA = 0.299702
ROC6 NOISE[IMAGE] of [IMAGE] of MEAN = 3.714779

SIGMA = 0.312875
ROC7 NOISE[IMAGE] of [IMAGE] of MEAN = 4.207202

SIGMA = 0.318104
ROC8 NOISE[IMAGE] of [IMAGE] of MEAN = 4.082785

SIGMA = 0.311417
ROC9 NOISE[IMAGE] of [IMAGE] of MEAN = 4.099320

SIGMA = 0.322655

Comment (if any):

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 6:39 PM