P_2x5_116_A

Production testing

Date:3/12/2007

Operator: Gino Bolla

start testing time:11:40 AM

Sensor: S_2x5_116, Data for leakage current measurement , and plot on overall it is a BAD sensor
ROCROC waferLabel
ROC0W34_XA4K3PT23D
ROC1W34_XA4K3PT23B
ROC2W34_XA4K3PT23A
ROC3W34_XA4K3PT22D
ROC4W34_XA4K3PT22C
ROC5W34_XA4K3PT17D
ROC6W34_XA4K3PT18A
ROC7W34_XA4K3PT18B
ROC8W34_XA4K3PT18C
ROC9W34_XA4K3PT18D

Depletion Voltage is -48 and suggested operational voltage is -88
Ibias_DAC, Ibias_DAC Data 140 140 134 142 130 130 144 140 150 136
Vana, VanaData 121 122 133 138 131 114 144 129 132 131
CalDelData and plots929473827410481807879
VthrCompData and plots63686570787487768076
TestDdata ,TestD Plots0000000000
LightData ,Light Plots0000000000
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe120125115105115155115115130125
Vsf130135135140135135145140135140
VoffsetOp606565758080110959575
VIbias_PH105100105100105100105100105100
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 5.506531

SIGMA = 0.429723
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 4.631426

SIGMA = 0.364023
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 5.313952

SIGMA = 0.428529
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 5.030611

SIGMA = 0.396308
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 5.085828

SIGMA = 0.415268
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 4.555774

SIGMA = 0.351711
ROC6 NOISE[IMAGE] of [IMAGE] of MEAN = 4.682908

SIGMA = 0.370273
ROC7 NOISE[IMAGE] of [IMAGE] of MEAN = 4.668166

SIGMA = 0.364567
ROC8 NOISE[IMAGE] of [IMAGE] of MEAN = 4.635776

SIGMA = 0.377696
ROC9 NOISE[IMAGE] of [IMAGE] of MEAN = 4.922243

SIGMA = 0.387397

Comment (if any): BAD IV

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 12:02 PM