P_2x5_109_C

Production testing

Date:4/25/2007

Operator: Cameron McKinney

start testing time:10:34 AM

Sensor: S_2x5_109, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0X94KFJT35D
ROC1X94KFJT25B
ROC2X94KFJT25A
ROC3X94KFJT25C
ROC4X94KFJT15B
ROC5X94KFJT65C
ROC6X94KFJT65D
ROC7X94KFJT65B
ROC8X94KFJT05A
ROC9X94KFJT15A

Depletion Voltage is -46 and suggested operational voltage is -86
Ibias_DAC, Ibias_DAC Data 140 128 128 150 150 138 144 136 128 150
Vana, VanaData 131 129 111 129 147 130 127 133 127 146
CalDelData and plots919778937384831029376
VthrCompData and plots73627471867061667284
TestDdata ,TestD Plots01000018179
LightData ,Light Plots01000019185
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD BAD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD BAD

Noise MAP

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe12012016014510012012511512595
Vsf140140140140145135140140140145
VoffsetOp7085707010565658080120
VIbias_PH10095100100100100100100100100
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 5.274425

SIGMA = 0.406911
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 4.696054

SIGMA = 0.361344
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 5.288921

SIGMA = 0.433848
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 4.629220

SIGMA = 0.371176
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 4.463422

SIGMA = 0.373806
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 5.028214

SIGMA = 0.401999
ROC6 NOISE[IMAGE] of [IMAGE] of MEAN = 4.524332

SIGMA = 0.344044
ROC7 NOISE[IMAGE] of [IMAGE] of MEAN = 5.159890

SIGMA = 0.408306
ROC8 NOISE[IMAGE] of [IMAGE] of MEAN = 5.127660

SIGMA = 0.404462
ROC9 NOISE[IMAGE] of [IMAGE] of MEAN = 4.049314

SIGMA = 0.314086

Comment (if any): Chip 9 has a bad corner of pixels.

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 10:56 AM