P_2x5_053_A

Production testing

Date:11/15/2007

Operator: Ozhan Koybasi

start testing time:4:30 PM

Sensor: S_2x5_053, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0W52_DOLQC8T53A
ROC1W52_DOLQC8T52C
ROC2W52_DOLQC8T52A
ROC3W52_DOLQC8T51D
ROC4W52_DOLQC8T51C
ROC5W52_DOLQC8T30A
ROC6W52_DOLQC8T30B
ROC7W52_DOLQC8T30D
ROC8W52_DOLQC8T31B
ROC9W52_DOLQC8T31C

Depletion Voltage is -46 and suggested operational voltage is -86
Ibias_DAC, Ibias_DAC Data 170 148 144 168 164 152 152 176 138 162
Vana, VanaData 159 138 137 145 160 121 141 155 131 146
CalDelData and plots64919080778294869686
VthrCompData and plots87878593928978887990
TestDdata ,TestD Plots2000010000
LightData ,Light Plots0000110000
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP at VMAX

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe10595110105105130959510595
Vsf150145140150165135140150140145
VoffsetOp1509580115110958511590115
VIbias_PH1001009510095105105100100100
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 3.310652

SIGMA = 0.244649
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 4.069831

SIGMA = 0.327552
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 4.113213

SIGMA = 0.307535
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 3.780457

SIGMA = 0.308989
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 3.917615

SIGMA = 0.317216
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 4.263267

SIGMA = 0.335913
ROC6 NOISE[IMAGE] of [IMAGE] of MEAN = 4.503914

SIGMA = 0.343246
ROC7 NOISE[IMAGE] of [IMAGE] of MEAN = 3.733972

SIGMA = 0.284669
ROC8 NOISE[IMAGE] of [IMAGE] of MEAN = 4.527476

SIGMA = 0.346792
ROC9 NOISE[IMAGE] of [IMAGE] of MEAN = 3.891641

SIGMA = 0.318280

Comment (if any):

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 5:03 PM