P_2x5_046_A

Production testing

Date:6/20/2007

Operator: Emily Grace

start testing time:9:48 AM

Sensor: S_2x5_046, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0W36_XD4K3LT16D
ROC1W36_XD4K3LT16C
ROC2W36_XD4K3LT16B
ROC3W36_XD4K3LT16A
ROC4W48_DVLQDVT40D
ROC5W49_D1LQGST74B
ROC6W49_D1LQGST16A
ROC7W49_D1LQGST17A
ROC8W49_D1LQGST17B
ROC9W49_D1LQGST15D

Depletion Voltage is -44 and suggested operational voltage is -84
Ibias_DAC, Ibias_DAC Data 152 142 172 162 164 146 158 158 144 150
Vana, VanaData 112 113 144 149 146 128 132 145 147 145
CalDelData and plots96848182769492859889
VthrCompData and plots75688084867779877987
TestDdata ,TestD Plots0080810820100
LightData ,Light Plots0000000000
Pass/Fail TestD GOOD GOOD BAD BAD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP at VMAX

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe14016085901001001159510085
Vsf135140145145145140140145150150
VoffsetOp6065110801009010511585110
VIbias_PH10010010010510510010010010095
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 4.897798

SIGMA = 0.401284
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 4.641047

SIGMA = 0.386586
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 3.679735

SIGMA = 0.283272
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 4.625698

SIGMA = 0.357445
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 4.371366

SIGMA = 0.346072
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 4.299816

SIGMA = 0.321565
ROC6 NOISE[IMAGE] of [IMAGE] of MEAN = 4.231006

SIGMA = 0.329108
ROC7 NOISE[IMAGE] of [IMAGE] of MEAN = 4.219981

SIGMA = 0.348010
ROC8 NOISE[IMAGE] of [IMAGE] of MEAN = 4.914953

SIGMA = 0.396348
ROC9 NOISE[IMAGE] of [IMAGE] of MEAN = 4.344805

SIGMA = 0.357614

Comment (if any):

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 10:19 AM