P_2x5_034_A

Production testing

Date:5/24/2007

Operator: Emily Grace

start testing time:4:21 PM

Sensor: S_2x5_034, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0W35_XH4K3HT16D
ROC1W35_XH4K3HT16C
ROC2W35_XH4K3HT16B
ROC3W35_XH4K3HT15D
ROC4W35_XH4K3HT15C
ROC5W49_D1LQG5T26B
ROC6W49_D1LQG5T26C
ROC7W49_D1LQG5T26D
ROC8W49_D1LQG5T27B
ROC9W49_D1LQG5T27D

Depletion Voltage is -42 and suggested operational voltage is -82
Ibias_DAC, Ibias_DAC Data 140 148 148 154 160 150 154 138 144 162
Vana, VanaData 126 133 131 116 128 131 149 129 142 153
CalDelData and plots877382877588931028492
VthrCompData and plots68787371728585777986
TestDdata ,TestD Plots4111000033
LightData ,Light Plots0000000010
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP at VMAX

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe120110115135120901001059095
Vsf130140140130140140150140150155
VoffsetOp50758050759511070100105
VIbias_PH100951001001059510010595100
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 4.998802

SIGMA = 0.399310
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 3.907832

SIGMA = 0.324388
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 4.425228

SIGMA = 0.373110
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 4.746213

SIGMA = 0.407554
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 5.042265

SIGMA = 0.431967
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 4.535480

SIGMA = 0.359857
ROC6 NOISE[IMAGE] of [IMAGE] of MEAN = 4.043418

SIGMA = 0.328599
ROC7 NOISE[IMAGE] of [IMAGE] of MEAN = 4.934293

SIGMA = 0.371255
ROC8 NOISE[IMAGE] of [IMAGE] of MEAN = 4.343398

SIGMA = 0.365070
ROC9 NOISE[IMAGE] of [IMAGE] of MEAN = 4.365635

SIGMA = 0.322534

Comment (if any):

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 4:50 PM