P_2x5_019_A

Production testing

Date:11/30/2007

Operator: Ozhan Koybasi

start testing time:11:47 AM

Sensor: S_2x5_019, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0W53_DXLQG9T74D
ROC1W53_DXLQG9T74C
ROC2W53_DXLQG9T74B
ROC3W53_DXLQG9T73D
ROC4W53_DXLQG9T73A
ROC5W53_DXLQG9T42D
ROC6W53_DXLQG9T43A
ROC7W53_DXLQG9T43B
ROC8W53_DXLQG9T43D
ROC9W53_DXLQG9T44A

Depletion Voltage is -52 and suggested operational voltage is -92
Ibias_DAC, Ibias_DAC Data 148 146 144 164 126 144 160 146 160 150
Vana, VanaData 145 128 131 144 124 147 137 139 134 154
CalDelData and plots1028396921019585969476
VthrCompData and plots76817185848786798392
TestDdata ,TestD Plots10005841477438304661
LightData ,Light Plots0000000000
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD BAD BAD BAD BAD BAD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP at VMAX

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe951550105000000
Vsf15015514065105000060
VoffsetOp1051008575655030454545
VIbias_PH804520104015501010
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 3.504615

SIGMA = 0.282750
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 2.889892

SIGMA = 0.222078
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 2.747796

SIGMA = 0.209664
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 2.738310

SIGMA = 0.196281
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 4.338654

SIGMA = 0.348811
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 3.900568

SIGMA = 0.467060
ROC6 NOISE[IMAGE] of [IMAGE] of MEAN = 2.805044

SIGMA = 0.215288
ROC7 NOISE[IMAGE] of [IMAGE] of MEAN = 2.605704

SIGMA = 0.191746
ROC8 NOISE[IMAGE] of [IMAGE] of MEAN = 3.171373

SIGMA = 0.405562
ROC9 NOISE[IMAGE] of [IMAGE] of MEAN = 2.729229

SIGMA = 0.208201

Comment (if any): ADC vs DAC plot is unusual.

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 12:16 PM