P_2x5_004_C-1

Production testing

Date:2/19/2007

Operator: Isaac Childres

start testing time:3:48 PM

Sensor: S_2x5_004, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0XG4KFCT65D
ROC1XG4KFCT66C
ROC2XG4KFCT66D
ROC3XG4KFCT67D
ROC4XG4KFCT68C
ROC5XG4KFCT63A
ROC6XG4KFCT62B
ROC7XG4KFCT62A
ROC8XG4KFCT61B
ROC9XG4KFCT68D

FIXED (not measured) Depletion Voltage is -50 and FIXED (not measured) suggested operational voltage is -150
Ibias_DAC, Ibias_DAC Data 136 144 128 140 142 140 150 142 144 134
Vana, VanaData 143 118 125 145 128 133 120 141 139 141
TestDdata ,TestD Plots1000200911
LightData ,Light Plots1000000001
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD

Comment (if any): Good.

This Device have been tested 1Times prior to this one and here are the links to the previous tests:

P_2x5_004_C.html,

End testing time: 3:53 PM