P_2x4T_177_C

Production testing

Date:5/7/2007

Operator: mia tosi

start testing time:11:18 AM

Sensor: S_2x4T_17, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0KNN0GDT55D
ROC1KNN0GDT45A
ROC2KNN0GDT35D
ROC3KNN0GDT65A
ROC4KNN0GDT15C
ROC5KNN0GDT25D
ROC6KNN0GDT75D
ROC7KNN0GDT05B

Depletion Voltage is -68 and suggested operational voltage is -108
Ibias_DAC, Ibias_DAC Data 112 102 110 112 98 114 110 118
Vana, VanaData 158 177 163 175 173 171 163 179
CalDelData and plots06969506907070
VthrCompData and plots06970587007070
TestDdata ,TestD Plots04178418541664186041864186
LightData ,Light Plots04244492633230264428
Pass/Fail TestD GOOD BAD BAD BAD BAD GOOD BAD BAD
Pass/Fail LIGHT GOOD BAD BAD BAD BAD GOOD BAD BAD

Noise MAP

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe019012505065160
Vsf014011570800140175
VoffsetOp002401600165045
VIbias_PH00000145095
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = NaN

SIGMA = NaN
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 2.784098

SIGMA = 0.420569
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 2.758958

SIGMA = 0.469002
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 2.035021

SIGMA = 0.628026
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 2.690394

SIGMA = 0.471372
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = NaN

SIGMA = NaN
ROC6 NOISE[IMAGE] of [IMAGE] of MEAN = 2.603273

SIGMA = 0.495007
ROC7 NOISE[IMAGE] of [IMAGE] of MEAN = NaN

SIGMA = NaN

Comment (if any): bad

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 11:44 AM