P_2x4T_156_A

Production testing

Date:6/20/2007

Operator: Emily Grace

start testing time:12:18 PM

Sensor: S_2x4T_15, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0W28_X54K5TT76D
ROC1W33_XC4K5LT15D
ROC2W28_X54K5TT76A
ROC3W48_DVCQDVT66D
ROC4W33_XC4K5LT13B
ROC5W28_X54K5TT42B
ROC6W28_X54K5TT42C
ROC7W28_X54K5TT42D

Depletion Voltage is -42 and suggested operational voltage is -82
Ibias_DAC, Ibias_DAC Data 158 148 154 150 148 158 160 156
Vana, VanaData 142 118 130 160 124 117 138 144
CalDelData and plots9583868483748378
VthrCompData and plots7577749377797584
TestDdata ,TestD Plots62865287934013002
LightData ,Light Plots50010000
Pass/Fail TestD BAD BAD BAD GOOD BAD BAD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP at VMAX

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe1051451001001401358585
Vsf140135140160135135135140
VoffsetOp90658011065759080
VIbias_PH10010510510510095100105
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 4.177282

SIGMA = 0.340113
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 5.183160

SIGMA = 0.419687
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 4.551506

SIGMA = 0.384198
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 4.313875

SIGMA = 0.347999
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 4.713653

SIGMA = 0.385080
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 4.133226

SIGMA = 0.328500
ROC6 NOISE[IMAGE] of [IMAGE] of MEAN = 4.195428

SIGMA = 0.348253
ROC7 NOISE[IMAGE] of [IMAGE] of MEAN = 4.793332

SIGMA = 0.397227

Comment (if any):

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 12:45 PM