P_2x4T_133_C-1

Production testing

Date:2/6/2007

Operator: Joseph Clampitt

start testing time:12:34 PM

Sensor: S_2x4T_13, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0XE4KFET49D
ROC1XE4KFET34A
ROC2XE4KFET48C
ROC3XE4KFET41A
ROC4XE4KFET42C
ROC5XE4KFET43C
ROC6XE4KFET33B
ROC7XE4KFET30B

FIXED (not measured) Depletion Voltage is -50 and FIXED (not measured) suggested operational voltage is -150

Noise MAP

[IMAGE] of

Noise MAP

[IMAGE] of

Ibias_DAC, Ibias_DAC Data 148 132 160 130 130 138 134 130
Vana, VanaData 122 127 135 125 128 145 132 118
TestDdata ,TestD Plots20000000
LightData ,Light Plots00000000
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD

Comment (if any): Good

This Device have been tested 1Times prior to this one and here are the links to the previous tests:

P_2x4T_133_C.html,

End testing time: 12:40 PM