P_2x4T_062_C

Production testing

Date:4/10/2007

Operator: Gino Bolla

start testing time:9:23 AM

Sensor: S_2x4T_06, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0XH4KFBT23D
ROC1XH4KFBT14D
ROC2XH4KFBT17C
ROC3XH4KFBT29C
ROC4XH4KFBT14C
ROC5XH4KFBT18A
ROC6XH4KFBT38D
ROC7XH4KFBT15D

Depletion Voltage is -48 and suggested operational voltage is -88
Ibias_DAC, Ibias_DAC Data 120 146 130 142 138 142 142 134
Vana, VanaData 114 133 132 131 126 128 116 126
CalDelData and plots92708671869510084
VthrCompData and plots6374689276696266
TestDdata ,TestD Plots0102591041
LightData ,Light Plots0103761000
Pass/Fail TestD GOOD GOOD GOOD BAD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD BAD GOOD GOOD GOOD GOOD

Noise MAP

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe150145110150135115155125
Vsf135140140140140140130135
VoffsetOp45707012070806060
VIbias_PH10010010010010510095100
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 5.901148

SIGMA = 0.476186
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 4.989693

SIGMA = 0.381851
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 4.754904

SIGMA = 0.385446
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 4.252123

SIGMA = 0.332569
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 5.600362

SIGMA = 0.443272
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 4.844863

SIGMA = 0.391147
ROC6 NOISE[IMAGE] of [IMAGE] of MEAN = 4.721208

SIGMA = 0.393488
ROC7 NOISE[IMAGE] of [IMAGE] of MEAN = 4.890153

SIGMA = 0.410309

Comment (if any): MANY-TOO-MANY BAD bumps

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 9:43 AM