P_2x4T_046_A

Production testing

Date:5/29/2007

Operator: Emily Grace

start testing time:11:34 AM

Sensor: S_2x4T_04, Data for leakage current measurement , and plot on overall it is a
ROCROC waferLabel
ROC0W36_XD4K3LT03B
ROC1W36_XD4K3LT18C
ROC2W36_XD4K3LT18B
ROC3W36_XD4K3LT18A
ROC4W49_D1LQGST04B
ROC5W49_D1LQGST04C
ROC6W49_D1LQGST04D
ROC7W49_D1LQGST05B

Depletion Voltage is -44 and suggested operational voltage is -84
Ibias_DAC, Ibias_DAC Data 148 150 160 154 148 152 162 164
Vana, VanaData 144 126 138 127 129 125 145 129
CalDelData and plots931028686981008189
VthrCompData and plots8264828084759486
TestDdata ,TestD Plots00010001
LightData ,Light Plots00000001
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP at VMAX

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe95115105130115130110120
Vsf140135140140140135145140
VoffsetOp11080100858090100105
VIbias_PH95105959595105100100
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 4.188828

SIGMA = 0.346766
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 4.630110

SIGMA = 0.336645
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 3.699231

SIGMA = 0.309265
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 4.149887

SIGMA = 0.320936
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 4.403705

SIGMA = 0.346165
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 4.562743

SIGMA = 0.349394
ROC6 NOISE[IMAGE] of [IMAGE] of MEAN = 4.319774

SIGMA = 0.326744
ROC7 NOISE[IMAGE] of [IMAGE] of MEAN = 4.214978

SIGMA = 0.331649

Comment (if any):

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 12:00 PM