P_2x4T_040_A

Production testing

Date:6/4/2007

Operator: Emily Grace

start testing time:9:40 AM

Sensor: S_2x4T_04, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0W35_XH4K3HT53B
ROC1W35_XH4K3HT52D
ROC2W35_XH4K3HT52C
ROC3W35_XH4K3HT52B
ROC4W36_XD4K3LT29A
ROC5W36_XD4K3LT29C
ROC6W36_XD4K3LT11A
ROC7W36_XD4K3LT11B

Depletion Voltage is -46 and suggested operational voltage is -86
Ibias_DAC, Ibias_DAC Data 166 166 166 142 168 162 144 144
Vana, VanaData 128 139 138 127 149 142 124 112
CalDelData and plots9665709073879694
VthrCompData and plots6385926792767672
TestDdata ,TestD Plots00000000
LightData ,Light Plots00000000
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP at VMAX

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe11011011013095100135175
Vsf140140140140150140135140
VoffsetOp80110100601101107055
VIbias_PH10010010010010010010095
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 4.487295

SIGMA = 0.373280
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 4.016968

SIGMA = 0.313405
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 4.159805

SIGMA = 0.341663
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 4.953305

SIGMA = 0.386016
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 4.163956

SIGMA = 0.341825
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 3.755360

SIGMA = 0.303392
ROC6 NOISE[IMAGE] of [IMAGE] of MEAN = 4.731841

SIGMA = 0.393831
ROC7 NOISE[IMAGE] of [IMAGE] of MEAN = 4.692620

SIGMA = 0.384092

Comment (if any):

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 10:06 AM