P_2x4T_038_A

Production testing

Date:3/6/2007

Operator: Joseph Clampitt

start testing time:11:07 AM

Sensor: S_2x4T_03, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0W33_XC4K5LT24D
ROC1W33_XC4K5LT24C
ROC2W33_XC4K5LT24B
ROC3W33_XC4K5LT23D
ROC4W33_XC4K5LT28A
ROC5W33_XC4K5LT28B
ROC6W33_XC4K5LT28D
ROC7W33_XC4K5LT29A

Depletion Voltage is -44 and suggested operational voltage is -84
Ibias_DAC, Ibias_DAC Data 142 132 126 130 128 144 134 138
Vana, VanaData 154 127 138 130 134 133 140 149
CalDelData and plots7883758085768379
VthrCompData and plots9476807277808693
TestDdata ,TestD Plots2550000010
LightData ,Light Plots1960000000
Pass/Fail TestD BAD GOOD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT BAD GOOD GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe90125115115120120105100
Vsf145140145140140140140145
VoffsetOp110707590707580110
VIbias_PH100100105100100105100105
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 4.240371

SIGMA = 0.315579
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 5.442560

SIGMA = 0.420148
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 5.166047

SIGMA = 0.411453
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 5.127012

SIGMA = 0.428747
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 5.186485

SIGMA = 0.382433
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 5.025295

SIGMA = 0.366654
ROC6 NOISE[IMAGE] of [IMAGE] of MEAN = 5.421741

SIGMA = 0.425761
ROC7 NOISE[IMAGE] of [IMAGE] of MEAN = 4.776722

SIGMA = 0.374808

Comment (if any): Many unbumped and dead pixels on ROC 0.

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 11:27 AM