P_2x4T_019

P_2x4T_019_A

Production testing

Date:11/28/2007

Operator: Ozhan Koybasi

start testing time:5:41 PM

Sensor: S_2x4T_01, Data for leakage current measurement , and plot on overall it is a GOOD sensor

ROC ROC wafer Label

ROC0

ROC1

ROC2

ROC3

ROC4

ROC5

ROC6

ROC7

Depletion Voltage is -46 and suggested operational voltage is -86

Ibias_DAC, Ibias_DAC Data 156 160 152 158 170 146 166 158

Vana, VanaData 149 153 156 148 151 144 148 149

CalDelData and plots 83 75 98 91 78 77 83 89

VthrCompData and plots 85 84 91 87 88 81 85 84

TestDdata ,TestD Plots 1 0 0 0 0 0 0 0

LightData ,Light Plots 0 0 0 0 0 0 1 0

Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD

Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP at VMAX

Efficiency MAP

EXTRA DACs for NOISE

VHldDe	90	100	100	95	100	95	90	90
Vsf	150	145	150	150	150	145	145	150
VoffsetOp	90	100	110	100	115	120	105	105
VIbias_PH	105	100	105	100	100	100	100	100

ROC0 NOISE			MEAN = 4.452618 SIGMA = 0.382125
ROC1 NOISE			MEAN = 4.033065 SIGMA = 0.294340
ROC2 NOISE			MEAN = 3.936393 SIGMA = 0.319567
ROC3 NOISE			MEAN = 4.188457 SIGMA = 0.327679
ROC4 NOISE			MEAN = 3.651523 SIGMA = 0.284806
ROC5 NOISE			MEAN = 3.990669 SIGMA = 0.322644
ROC6 NOISE			MEAN = 3.772772 SIGMA = 0.284784
ROC7 NOISE			MEAN = 4.073710 SIGMA = 0.314590

Comment (if any):

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 6:08 PM

Ibias_DAC, Ibias_DAC Data	156	160	152	158	170	146	166	158
Vana, VanaData	149	153	156	148	151	144	148	149
CalDelData and plots	83	75	98	91	78	77	83	89
VthrCompData and plots	85	84	91	87	88	81	85	84
TestDdata ,TestD Plots	1	0	0	0	0	0	0	0
LightData ,Light Plots	0	0	0	0	0	0	1	0
Pass/Fail TestD	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD
Pass/Fail LIGHT	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD