Sensor: S_2x4T_01, Data for leakage current measurement , and plot on overall it is a BAD sensor

ROC	ROC wafer	Label
ROC0	XE4K3KT	27C
ROC1	XE4K3KT	26D
ROC2	XE4K3KT	26C
ROC3	XE4K3KT	25D
ROC4	XE4K3KT	23C
ROC5	XE4K3KT	24C
ROC6	XE4K3KT	24D
ROC7	XE4K3KT	25C

Depletion Voltage is -48 and suggested operational voltage is -88

Ibias_DAC, Ibias_DAC Data	150	132	128	132	132	126	130	130
Vana, VanaData	126	133	127	127	117	138	135	130
CalDelData and plots	90	79	79	89	77	88	98	92
VthrCompData and plots	71	75	71	68	76	76	67	76
TestDdata ,TestD Plots	1	0	0	0	0	4	0	1
LightData ,Light Plots	1	0	0	0	0	0	0	0
Pass/Fail TestD	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD
Pass/Fail LIGHT	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD

Noise MAP

Efficiency MAP

ROC0 NOISE			MEAN = 4.983450 SIGMA = 0.392088
ROC1 NOISE			MEAN = 4.840634 SIGMA = 0.403290
ROC2 NOISE			MEAN = 4.485577 SIGMA = 0.353365
ROC3 NOISE			MEAN = 4.633396 SIGMA = 0.356063
ROC4 NOISE			MEAN = 4.208270 SIGMA = 0.317836
ROC5 NOISE			MEAN = 4.805614 SIGMA = 0.362132
ROC6 NOISE			MEAN = 5.392822 SIGMA = 0.443454
ROC7 NOISE			MEAN = 5.036388 SIGMA = 0.394343

Comment (if any): Bad IV. Spares.

End testing time: 2:30 PM