P_2x4B_172_C-4

Production testing

Date:8/6/2007

Operator: Emily Grace

start testing time:11:09 AM

Sensor: S_2x4B_17, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0XH4KFBT49D
ROC1XH4KFBT40A
ROC2XH4KFBT40B
ROC3XH4KFBT41A
ROC4XH4KFBT41B
ROC5XH4KFBT42A
ROC6XH4KFBT42B
ROC7XH4KFBT43A

This plaquette was reworked. Old results here

Inspected by Arndt Kirk on date 7/30/2007
PictureComment
[IMAGE] of Picture of substance on backside of ROC0 (representative of substance on backsides of all original ROCs) in the reworked BMM. The substance is not removed by gentle swabbing with alcohol.

Ibias_DAC, Ibias_DAC Data 176 146 148 144 154 146 160 138
Vana, VanaData 147 123 124 126 130 131 140 127
CalDelData and plots7787788779817087
VthrCompData and plots8373727375857571