P_2x4B_128_A

Production testing

Date:11/27/2006

Operator: Isaac Childres

start testing time:3:47 PM

Sensor: S_2x4B_12, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0W19_XN4K38T45A
ROC1W19_XN4K38T44B
ROC2W19_XN4K38T44A
ROC3W19_XN4K38T42B
ROC4W19_XN4K38T16D
ROC5W19_XN4K38T17A
ROC6W19_XN4K38T17B
ROC7W19_XN4K38T17C

Depletion Voltage is -48 and suggested operational voltage is -88
Ibias_DAC, Ibias_DAC Data 125 142 139 138 152 138 127 120
Vana, VanaData 129 127 143 127 121 127 127 114
CalDelData and plots8495808173819299
VthrCompData and plots8174897879786662
TestDdata ,TestD Plots0757900000
LightData ,Light Plots00000000
Pass/Fail TestD GOOD BAD BAD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD

Comment (if any): Dead row on chip 2.

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 4:05 PM