P_2x4B_115_A

Production testing

Date:3/12/2007

Operator: Gino Bolla

start testing time:1:38 PM

Sensor: S_2x4B_11, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0W34_XA4K3PT40B
ROC1W34_XA4K3PT40A
ROC2W34_XA4K3PT58D
ROC3W34_XA4K3PT58A
ROC4W34_XA4K3PT31D
ROC5W34_XA4K3PT32A
ROC6W34_XA4K3PT32C
ROC7W34_XA4K3PT32D

Depletion Voltage is -48 and suggested operational voltage is -88
Ibias_DAC, Ibias_DAC Data 134 132 148 144 136 150 138 144
Vana, VanaData 117 124 144 131 143 153 123 143
CalDelData and plots8575958499738759
VthrCompData and plots7474808474928588
TestDdata ,TestD Plots000004520
LightData ,Light Plots00000000
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD BAD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe1251359510511595095
Vsf1351351401401401500140
VoffsetOp65501108590230085
VIbias_PH100100100100105100095
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 4.265528

SIGMA = 0.336560
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 5.815231

SIGMA = 0.496508
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 4.178315

SIGMA = 0.322833
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 5.139056

SIGMA = 0.385769
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 4.830220

SIGMA = 0.396068
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 3.616174

SIGMA = 0.267030
ROC6 NOISE[IMAGE] of [IMAGE] of MEAN = NaN

SIGMA = NaN
ROC7 NOISE[IMAGE] of [IMAGE] of MEAN = 4.454056

SIGMA = 0.333427

Comment (if any):

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 2:09 PM