P_2x4B_083_A-2

Production testing

Date:11/10/2006

Operator: Isaac Childres

start testing time:3:41 PM

Sensor: S_2x4B_08, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0W18_XJ4K3FT03D
ROC1W18_XJ4K3FT39A
ROC2W18_XJ4K3FT38C
ROC3W18_XJ4K3FT37D
ROC4W18_XJ4K3FT14C
ROC5W18_XJ4K3FT14D
ROC6W20_XP4K3AT18D
ROC7W18_XJ4K3FT15B

Depletion Voltage is -52 and suggested operational voltage is -92
Ibias_DAC, Ibias_DAC Data 147 139 130 121 127 135 148 138
Vana, VanaData 121 141 138 131 121 127 147 133
CalDelData and plots9172928784917290
VthrCompData and plots7174726670698269
TestDdata ,TestD Plots00000000
LightData ,Light Plots00000000
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD

Comment (if any): TestD badness seems to have gone away.

This Device have been tested 2Times prior to this one and here are the links to the previous tests:

P_2x4B_083_A-1.html,

P_2x4B_083_A.html,

End testing time: 4:03 PM