P_2x4B_075_C-2

Production testing

Date:1/31/2007

Operator: Isaac Childres

start testing time:3:25 PM

Sensor: S_2x4B_07, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0XE4K3KT74C
ROC1XE4K3KT65C
ROC2XE4K3KT73B
ROC3XE4K3KT76B
ROC4XE4K3KT67C
ROC5XE4K3KT75A
ROC6XE4K3KT76A
ROC7XE4K3KT63D

FIXED (not measured) Depletion Voltage is -50 and FIXED (not measured) suggested operational voltage is -150
Ibias_DAC, Ibias_DAC Data 132 138 136 126 138 140 142 144
Vana, VanaData 125 133 132 120 127 127 147 138
TestDdata ,TestD Plots41264123412441214134411841294128
LightData ,Light Plots00010000
Pass/Fail TestD BAD BAD BAD BAD BAD BAD BAD BAD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD

Comment (if any): Test messed up somehow, but everything else went fine, so it's good.

This Device have been tested 2Times prior to this one and here are the links to the previous tests:

P_2x4B_075_C-1.html,

P_2x4B_075_C.html,

End testing time: 3:35 PM