P_2x4B_073_A-1

Production testing

Date:6/12/2007

Operator: Emily Grace

start testing time:11:14 AM

Sensor: S_2x4B_07, Data for leakage current measurement , and plot on overall it is a
ROCROC waferLabel
ROC0W45_D3LQFLT54C
ROC1W45_D3LQFLT54B
ROC2W45_D3LQFLT54A
ROC3W45_D3LQFLT53D
ROC4W45_D3LQFLT34C
ROC5W45_D3LQFLT35B
ROC6W45_D3LQFLT36C
ROC7W45_D3LQFLT37A

Depletion Voltage is -46 and suggested operational voltage is -86
Ibias_DAC, Ibias_DAC Data 160 162 150 170 150 166 164 158
Vana, VanaData 138 153 137 146 156 155 141 151
CalDelData and plots7994868171759478
VthrCompData and plots8986859191928489
TestDdata ,TestD Plots175721152140
LightData ,Light Plots01000010
Pass/Fail TestD GOOD BAD BAD GOOD GOOD BAD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP at VMAX

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe1159590959510011595
Vsf140145145150155160140150
VoffsetOp11011010010512012080115
VIbias_PH100100100105105100105100
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 3.980859

SIGMA = 0.313306
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 4.430570

SIGMA = 0.386802
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 4.285566

SIGMA = 0.344690
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 4.339388

SIGMA = 0.339949
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 4.184990

SIGMA = 0.314324
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 13431.365035

SIGMA = 226967.341273
ROC6 NOISE[IMAGE] of [IMAGE] of MEAN = 4.354478

SIGMA = 0.348111
ROC7 NOISE[IMAGE] of [IMAGE] of MEAN = 4.026418

SIGMA = 0.329632

Comment (if any):

This Device have been tested 1Times prior to this one and here are the links to the previous tests:

P_2x4B_073_A.html,

End testing time: 11:40 AM