P_2x4B_045_C-1

Production testing

Date:5/22/2007

Operator: Gino Bolla

start testing time:4:13 PM

Sensor: S_2x4B_04, Data for leakage current measurement , and plot on overall it is a
ROCROC waferLabel
ROC0XE4K3KT57C
ROC1XE4K3KT56D
ROC2XE4K3KT55D
ROC3XE4K3KT54D
ROC4XE4K3KT53A
ROC5XE4K3KT52B
ROC6XE4K3KT52A
ROC7XE4K3KT51B

FIXED (not measured) Depletion Voltage is -50 and FIXED (not measured) suggested operational voltage is -150
Ibias_DAC, Ibias_DAC Data 142 144 134 140 132 140 136 114
Vana, VanaData 132 130 135 135 129 145 131 123
TestDdata ,TestD Plots8101530137808900
LightData ,Light Plots151000130
Pass/Fail TestD GOOD BAD GOOD GOOD BAD GOOD BAD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD

Comment (if any): still good after encapsulation

This Device have been tested 1Times prior to this one and here are the links to the previous tests:

P_2x4B_045_C.html,

End testing time: 4:18 PM