P_2x4B_036_C-1

Production testing

Date:1/17/2007

Operator: Isaac Childres

start testing time:3:55 PM

Sensor: S_2x4B_03, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0XE4KFET03D
ROC1XE4KFET05B
ROC2XE4KFET18C
ROC3XE4KFET15D
ROC4XE4KFET05A
ROC5XE4KFET03A
ROC6XE4KFET04A
ROC7XE4KFET05D

FIXED (not measured) Depletion Voltage is -50 and FIXED (not measured) suggested operational voltage is -150
Ibias_DAC, Ibias_DAC Data 132 134 158 124 136 140 134 134
Vana, VanaData 110 122 147 127 127 132 127 127
TestDdata ,TestD Plots10000000
LightData ,Light Plots20000001
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD

Comment (if any): Okay.

This Device have been tested 1Times prior to this one and here are the links to the previous tests:

P_2x4B_036_C.html,

End testing time: 4:00 PM