P_2x4B_028_C-1

Production testing

Date:2/12/2007

Operator: Isaac Childres

start testing time:10:52 AM

Sensor: S_2x4B_02, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0XE4K3KT38B
ROC1XE4K3KT33A
ROC2XE4K3KT32B
ROC3XE4K3KT32A
ROC4XE4K3KT37A
ROC5XE4K3KT36B
ROC6XE4K3KT35A
ROC7XE4K3KT34B

Depletion Voltage is -50 and suggested operational voltage is -90
Ibias_DAC, Ibias_DAC Data 140 132 138 130 142 144 130 138
Vana, VanaData 123 133 121 128 133 131 123 125
CalDelData and plots78941018683887879
VthrCompData and plots8465697466708875
TestDdata ,TestD Plots00103000
LightData ,Light Plots00100000
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP

[IMAGE] of

Efficiency MAP

[IMAGE] of

ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 4.515405

SIGMA = 0.343679
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 4.269653

SIGMA = 0.328804
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 3.884154

SIGMA = 0.293516
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 4.515124

SIGMA = 0.359551
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 5.102069

SIGMA = 0.412272
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 4.274431

SIGMA = 0.329083
ROC6 NOISE[IMAGE] of [IMAGE] of MEAN = 4.262336

SIGMA = 0.331378
ROC7 NOISE[IMAGE] of [IMAGE] of MEAN = 4.456912

SIGMA = 0.359696

Comment (if any): Good.

This Device have been tested 1Times prior to this one and here are the links to the previous tests:

P_2x4B_028_C.html,

End testing time: 11:09 AM