P_2x4B_014_C

Production testing

Date:2/9/2007

Operator: Isaac Childres

start testing time:1:49 PM

Sensor: S_2x4B_01, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0XE4K3KT22D
ROC1XE4K3KT22C
ROC2XE4K3KT21D
ROC3XE4K3KT14B
ROC4XE4K3KT17A
ROC5XE4K3KT16B
ROC6XE4K3KT15B
ROC7XE4K3KT15A

Depletion Voltage is -52 and suggested operational voltage is -92
Ibias_DAC, Ibias_DAC Data 134 144 138 128 134 138 148 136
Vana, VanaData 125 133 129 125 126 126 144 134
CalDelData and plots8378808094867386
VthrCompData and plots7379877760707571
TestDdata ,TestD Plots00001107
LightData ,Light Plots00000000
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP

[IMAGE] of

Efficiency MAP

[IMAGE] of

ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 3.954188

SIGMA = 0.301099
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 4.136957

SIGMA = 0.332116
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 5.031156

SIGMA = 0.403530
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 4.207500

SIGMA = 0.328665
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 4.307366

SIGMA = 0.344999
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 4.263773

SIGMA = 0.330263
ROC6 NOISE[IMAGE] of [IMAGE] of MEAN = 5.844682

SIGMA = 0.446496
ROC7 NOISE[IMAGE] of [IMAGE] of MEAN = 4.487289

SIGMA = 0.355804

Comment (if any): Okay.

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 2:11 PM