P_2x3T_175_A

Production testing

Date:4/30/2007

Operator: mia tosi

start testing time:1:52 PM

Sensor: S_2x3T_17, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0W28_X54K5TT51B
ROC1W28_X54K5TT51A
ROC2W28_X54K5TT68D
ROC3W28_X54K5TT48C
ROC4W28_X54K5TT49B
ROC5W33_XC4K5LT16D

Depletion Voltage is -44 and suggested operational voltage is -84
Ibias_DAC, Ibias_DAC Data 130 140 128 138 146 128
Vana, VanaData 113 141 129 138 128 116
CalDelData and plots918583747583
VthrCompData and plots677276776674
TestDdata ,TestD Plots600010
LightData ,Light Plots000000
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe1508512085115140
Vsf130140140140140140
VoffsetOp759080758550
VIbias_PH1001059510510595
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 5.069082

SIGMA = 0.391750
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 5.245661

SIGMA = 0.403465
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 5.004394

SIGMA = 0.367616
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 5.603109

SIGMA = 0.442752
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 4.848564

SIGMA = 0.403745
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 5.179794

SIGMA = 0.405837

Comment (if any): good

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 2:13 PM