P_2x3T_168

P_2x3T_168_C

Production testing

Date:5/29/2007

Operator: Emily Grace

start testing time:11:04 AM

Sensor: S_2x3T_16, Data for leakage current measurement , and plot on overall it is a GOOD sensor

ROC ROC wafer Label

ROC0 KBNG0QT 34D

ROC1 KBNG0QT 64A

ROC2 KBNG0QT 74D

ROC3 KBNG0QT 75D

ROC4 KBNG0QT 54A

ROC5 KBNG0QT 44C

ROC	ROC wafer	Label
ROC0	KBNG0QT	34D
ROC1	KBNG0QT	64A
ROC2	KBNG0QT	74D
ROC3	KBNG0QT	75D
ROC4	KBNG0QT	54A
ROC5	KBNG0QT	44C

Depletion Voltage is -42 and suggested operational voltage is -82

Ibias_DAC, Ibias_DAC Data 158 150 162 158 154 174

Vana, VanaData 142 132 129 149 143 150

CalDelData and plots 63 75 78 81 78 70

VthrCompData and plots 87 83 86 84 86 92

TestDdata ,TestD Plots 0 4 2 0 0 4

LightData ,Light Plots 0 1 10 0 0 7

Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD

Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP at VMAX

Efficiency MAP

EXTRA DACs for NOISE

VHldDe	90	120	120	95	100	100
Vsf	145	140	140	145	140	155
VoffsetOp	110	70	90	100	100	95
VIbias_PH	105	100	95	100	95	100

ROC0 NOISE			MEAN = 4.191407 SIGMA = 0.339490
ROC1 NOISE			MEAN = 4.881726 SIGMA = 0.392473
ROC2 NOISE			MEAN = 4.139614 SIGMA = 0.341868
ROC3 NOISE			MEAN = 4.300353 SIGMA = 0.349706
ROC4 NOISE			MEAN = 4.133517 SIGMA = 0.308644
ROC5 NOISE			MEAN = 3.947185 SIGMA = 0.328024

Comment (if any):

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 11:30 AM

Ibias_DAC, Ibias_DAC Data	158	150	162	158	154	174
Vana, VanaData	142	132	129	149	143	150
CalDelData and plots	63	75	78	81	78	70
VthrCompData and plots	87	83	86	84	86	92
TestDdata ,TestD Plots	0	4	2	0	0	4
LightData ,Light Plots	0	1	10	0	0	7
Pass/Fail TestD	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD
Pass/Fail LIGHT	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD