P_2x3T_166

P_2x3T_166_C

Production testing

Date:3/22/2007

Operator: Joseph Clampitt

start testing time:10:57 AM

Sensor: S_2x3T_16, Data for leakage current measurement , and plot on overall it is a GOOD sensor

ROC ROC wafer Label

ROC0 XG4KFCT 05D

ROC1 XG4KFCT 06C

ROC2 XG4KFCT 05C

ROC3 XG4KFCT 04D

ROC4 XG4KFCT 04C

ROC5 XG4KFCT 03C

ROC	ROC wafer	Label
ROC0	XG4KFCT	05D
ROC1	XG4KFCT	06C
ROC2	XG4KFCT	05C
ROC3	XG4KFCT	04D
ROC4	XG4KFCT	04C
ROC5	XG4KFCT	03C

Depletion Voltage is -46 and suggested operational voltage is -86

Ibias_DAC, Ibias_DAC Data 140 138 144 128 126 144

Vana, VanaData 139 127 124 126 125 114

CalDelData and plots 98 77 96 86 95 88

VthrCompData and plots 76 80 72 84 76 77

TestDdata ,TestD Plots 0 3 1 2 1 2

LightData ,Light Plots 0 0 1 1 1 0

Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD

Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP

Efficiency MAP

EXTRA DACs for NOISE

VHldDe	100	130	140	110	135	160
Vsf	140	140	135	140	140	135
VoffsetOp	85	70	80	70	70	75
VIbias_PH	100	105	100	95	95	100

ROC0 NOISE			MEAN = 4.988000 SIGMA = 0.406968
ROC1 NOISE			MEAN = 5.509768 SIGMA = 0.431359
ROC2 NOISE			MEAN = 4.887527 SIGMA = 0.377789
ROC3 NOISE			MEAN = 5.077466 SIGMA = 0.390118
ROC4 NOISE			MEAN = 5.299584 SIGMA = 0.449711
ROC5 NOISE			MEAN = 4.694652 SIGMA = 0.384180

Comment (if any): Good

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 11:16 AM

Ibias_DAC, Ibias_DAC Data	140	138	144	128	126	144
Vana, VanaData	139	127	124	126	125	114
CalDelData and plots	98	77	96	86	95	88
VthrCompData and plots	76	80	72	84	76	77
TestDdata ,TestD Plots	0	3	1	2	1	2
LightData ,Light Plots	0	0	1	1	1	0
Pass/Fail TestD	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD
Pass/Fail LIGHT	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD