P_2x3T_148

P_2x3T_148_A

Production testing

Date:2/23/2007

Operator: Isaac Childres

start testing time:1:41 PM

Sensor: S_2x3T_14, Data for leakage current measurement , and plot on overall it is a GOOD sensor

ROC ROC wafer Label

ROC0 W29_X64K5ST 27D

ROC1 W29_X64K5ST 27C

ROC2 W29_X64K5ST 27B

ROC3 W33_XC4K5LT 74C

ROC4 W33_XC4K5LT 74D

ROC5 W33_XC4K5LT 75A

ROC	ROC wafer	Label
ROC0	W29_X64K5ST	27D
ROC1	W29_X64K5ST	27C
ROC2	W29_X64K5ST	27B
ROC3	W33_XC4K5LT	74C
ROC4	W33_XC4K5LT	74D
ROC5	W33_XC4K5LT	75A

Depletion Voltage is -46 and suggested operational voltage is -86

Ibias_DAC, Ibias_DAC Data 132 130 126 144 144 138

Vana, VanaData 117 116 116 138 151 134

CalDelData and plots 89 73 98 69 67 76

VthrCompData and plots 71 71 61 87 92 71

TestDdata ,TestD Plots 2 0 0 0 0 0

LightData ,Light Plots 0 0 0 0 0 0

Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD

Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP

Efficiency MAP

EXTRA DACs for NOISE

VHldDe	145	145	170	120	100	100
Vsf	145	130	135	140	150	140
VoffsetOp	70	80	55	95	115	65
VIbias_PH	100	95	95	100	100	105

ROC0 NOISE			MEAN = 4.583102 SIGMA = 0.371005
ROC1 NOISE			MEAN = 5.086305 SIGMA = 0.398145
ROC2 NOISE			MEAN = 5.572999 SIGMA = 0.449991
ROC3 NOISE			MEAN = 4.595773 SIGMA = 0.376932
ROC4 NOISE			MEAN = 4.111779 SIGMA = 0.331319
ROC5 NOISE			MEAN = 5.212015 SIGMA = 0.434025

Comment (if any): Good.

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 2:01 PM

Ibias_DAC, Ibias_DAC Data	132	130	126	144	144	138
Vana, VanaData	117	116	116	138	151	134
CalDelData and plots	89	73	98	69	67	76
VthrCompData and plots	71	71	61	87	92	71
TestDdata ,TestD Plots	2	0	0	0	0	0
LightData ,Light Plots	0	0	0	0	0	0
Pass/Fail TestD	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD
Pass/Fail LIGHT	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD