P_2x3T_136_A

Production testing

Date:12/7/2007

Operator: Ozhan Koybasi

start testing time:4:25 PM

Sensor: S_2x3T_13, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0W52_DOLQC8T76D
ROC1W52_DOLQC8T75C
ROC2W52_DOLQC8T75A
ROC3W52_DOLQC8T44B
ROC4W52_DOLQC8T44C
ROC5W52_DOLQC8T44D

Depletion Voltage is -44 and suggested operational voltage is -84
Ibias_DAC, Ibias_DAC Data 166 176 176 160 162 158
Vana, VanaData 149 149 166 154 144 158
CalDelData and plots668051626483
VthrCompData and plots888887869288
TestDdata ,TestD Plots000001
LightData ,Light Plots000000
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP at VMAX

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe9010010511095105
Vsf150150165150150150
VoffsetOp100135145125125135
VIbias_PH10010010095100100
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 3.743728

SIGMA = 0.272500
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 3.235725

SIGMA = 0.241853
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 3.274905

SIGMA = 0.248872
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 3.724044

SIGMA = 0.297142
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 3.710902

SIGMA = 0.288836
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 3.734157

SIGMA = 0.285280

Comment (if any):

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 4:53 PM